Publications de Mustafa Kangül

Fabrication of fluid-compatible trilayer cantilevers with integrated piezoelectric actuators

Luis Guillermo Villanueva Torrijo, Georg Fantner, Damien Maillard, Nahid Hosseini, Matthias Neuenschwander, Mustafa Kangül

Microcantilevers are popular transducers thanks to their simple design and a high sensitivity. In many applications, the cantilevers need to be actuated, either to induce a controlled deflection or to excite the resonance. This can be achieved with integra ...

2025

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

Georg Fantner, Marcos Penedo Garcia, Navid Asmari Saadabad, Santiago Harald Andany, Mustafa Kangül

Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types, including biological sa ...

Beilstein-Institut2024

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Georg Fantner, Maartje Martina Cornelia Bastings, Bahareh Ghadiani, Marcos Penedo Garcia, Santiago Harald Andany, Cem Tekin, Mustafa Kangül, Veronika Cencen

High-speed atomic force microscopy (HS-AFM) is a popular molecular imaging technique for visualizing single-molecule biological processes in real-time due to its ability to image under physiological conditions in liquid environments. The photothermal off-r ...

Journal Of Visualized Experiments2024

A high-bandwidth voltage amplifier for driving piezoelectric actuators in high-speed atomic force microscopy

Georg Fantner, Adrian Pascal Nievergelt, Santiago Harald Andany, Mustafa Kangül

High-speed atomic force microscopy (HS-AFM) is a technique capable of revealing the dynamics of biomolecules and living organisms at the nanoscale with a remarkable temporal resolution. The phase delay in the feedback loop dictates the achievable speed of ...

AIP Publishing2023

Advancing atomic force microscopy through open source instrumentation

Mustafa Kangül

Atomic force microscopy (AFM), a member of the scanning probe microscopy (SPM) family, holds a unique position as a nano-characterization instrument in the fields of physics, chemistry, and biology. Its ability to provide atomic resolution and operate in v ...

EPFL2023

Data-Driven Feedforward Hysteresis Compensation with Genetic Algorithm for Atomic Force Microscope

Alireza Karimi, Georg Fantner, Navid Asmari Saadabad, Santiago Harald Andany, Mustafa Kangül

Nonlinear dynamics of piezo actuators such as hysteresis, distort the Atomic Force Microscopy (AFM) images as they adversely affect the accuracy of the nano-positioning setup. To compensate for the effects of hysteresis on lateral scanner actuators of AFM, ...

IEEE2022

A second harmonic based resonance characterization method for MEMS electrostatic resonators

Ozge Zorlu, Mustafa Kangül, Furkan Gökçe, Eren Aydin

This paper presents a novel read-out approach both for eliminating parasitic feedthrough current and for enhancing the quality-factor (Q) of the resonating system at the same time. A new resonance characterization method based on sensing second harmonic co ...

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