Kyungjin Kim

Cette personne n’est plus à l’EPFL

Publications associées (17)

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Results of the TF conductor performance qualification samples for the ITER project

Pierluigi Bruzzone, Boris Stepanov, Kyungjin Kim

The performance of the toroidal field (TF) magnet conductors for the ITER machine are qualified by a short full-size sample (4 m) current sharing temperature (T-cs) test in the SULTAN facility at CRPP in Villigen, Switzerland, using the operating current o ...

Iop Publishing Ltd2012

Conductor Performance Qualification of TFKO3 Sample for ITER TF Magnet

Pierluigi Bruzzone, Boris Stepanov, Kyungjin Kim

Two identical conductor samples were fabricated from 110 m length cable prepared for qualification of the manufacturing process for Phase II procurement of ITER TF conductor. Superconducting strand characteristics, cabling specifications, and the stainless ...

IEEE-Inst Electrical Electronics Engineers Inc2012

Epigenetic memory in induced pluripotent stem cells

Olaia Maria Naveiras Torres-Quiroga, Kyungjin Kim, Ji Hyun Kim

Somatic cell nuclear transfer and transcription-factor-based reprogramming revert adult cells to an embryonic state, and yield pluripotent stem cells that can generate all tissues. Through different mechanisms and kinetics, these two reprogramming methods ...

2010

Performance test of TFK02 qualification sample for ITER TF conductor

Pierluigi Bruzzone, Kyungjin Kim

IEEE2010

Results of a new generation of ITER TF conductor samples in SULTAN

Pierluigi Bruzzone, Boris Stepanov, Rainer Wesche, Kyungjin Kim

IEEE Institute of Electrical and Electronics Engineers2008

Development and Sultan test result of ITER conductor samples of Korea

Pierluigi Bruzzone, Kyungjin Kim

2008

Predictive analysis of the ITER Poloidal Field Conductor Insert (PFCI) test program

Rainer Wesche, Kyungjin Kim

In this paper we discuss the predictive analysis performed in support of the test program of the International Thermonuclear Experimental Reactor (ITER) Poloidal Field Conductor Insert (PFCI). A subset of the test program items was considered, with particu ...

IEEE Institute of Electrical and Electronics Engineers2007

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