We have synthesized Si Nps rich submicron area within a thin SiO2 layer using a new method called “stencil-masked ion implantation”. It consists in implanting silicon ions at ultra-low energy through windows (from 50nm to 2μm) opened in a stencil mask containing. After thermal annealing the implanted regions perfectly mimic the mask geometry. Energy-filtered transmission electron microscopy images and PL measurement reveal that smaller nanocrystals are formed near the edges of the implanted areas due to a dose edge effect.
Aleksandra Radenovic, Andras Kis, Mukesh Kumar Tripathi, Mukeshchand Thakur, Michal Daniel Macha, Yanfei Zhao, Hyungoo Ji
Klaus Kern, Yi Wang, Marko Burghard, Stephan Rauschenbach, Sabine Abb, Sven Alexander Szilagyi, Hannah Julia Ochner