Design of a ''beetle-type'' atomic force microscope using the beam deflection technique
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We present an atomic force microscope ~AFM for operation at low temperatures under ultrahigh vacuum conditions. It uses the laser beam deflection method to measure the bending of the cantilever. The four quadrant photodiode allows the detection of vertical ...
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Fluorescence resonance energy transfer (FRET) was obsd. between donor dye mols. deposited onto the sample surface and acceptor dye mols. deposited onto the scanning near-field optical microscope (SNOM) or at. force microscope tip. FRET was obsd. only when ...
We report on the first successful operation of a scanning force microscope using microfabricated capacitive force sensors. The sensors, which are made from single crystal silicon on insulator wafers, consist of a cantilever spring with integrated tip at th ...
The velocity and humidity dependence of nanoscopic sliding friction has been studied on CrN and diamondlike carbon surfaces with an atomic force microscope. The surface wettability is found to be decisive. Partially hydrophilic surfaces show a logarithmic ...
A novel silicon microfabricated sensor head for the scanning force microscope (SFM) is presented. The force sensor consists of a cantilever and an adjacent counter-electrode forming the two plates of a capacitor. Force-induced cantilever deflections are mo ...
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Crystals of hexamethylenetetramine (HMT) with aliphatic dicarboxylic acids in 1:1 molar ratio exhibit different behaviour depending on the number n of carbons in the aliphatic chain. For n=8 and 10, incommensurate phases have been observed, while for n=9, ...
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