We report about the development of a planar support for biological samples. The aim is to combine AFM and patch-clamp measurements, in order to perform simultaneous measurements of topography and electrical properties of biological membranes. Sub-micrometer apertures have been fabricated using standard MEMS techniques. The electrical quality of the support has been experimentally assessed. © 2005 Elsevier B.V. All rights reserved.
Georg Fantner, Johann Michler, Veronika Cencen
Christof Holliger, Henning Paul-Julius Stahlberg, Julien Maillard, Dongchun Ni, Lorenzo Cimmino
Francesco Stellacci, Paulo Henrique Jacob Silva, Xufeng Xu, Camilla Servidio