Scanning probe microscope for imaging material e.g. metal, has strain gauge coupled to opposed actuators arranged in opposed push or push-pull configuration to measure differential motion of opposed actuators
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NOVELTY - The microscope has a housing (12), and two actuators (14, 16) are arranged in an opposed push-pull configuration that is coupled to the housing. A support (22) is coupled to the housing and to one of the two actuators at a position that is spaced ...
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