Domain wall conduction in bismuth ferrite thin films
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Fatigue phenomena occurring in Pb(ZrxTi1-x)O-3 ferroelectric thin-film capacitors (FECAP) with Pt electrodes are studied by means of conduction measurements in the cold-field-emission (tunneling) regime. We have determined that conduction in virgin FECAPs ...
It is shown that at weak alternating stress the relationship between the piezoelectrically induced charge and applied stress in ferroelectric ceramics has the same form as the Rayleigh law for magnetization versus magnetic field in ferromagnetic materials. ...
Dielectric properties of perovskites are studied both to gain insight into fundamental aspects of the freezing of polar disorder, and to investigate their technological potential. The dynamics of freezing of polar disorder is investigated in single crystal ...
The size, shape, and polarization orientation of fatigued areas formed during the suppression of the switchable polarization (P-r(s)) (fatigue) in Ft-FZT-Pt ferroelectric capacitors (FECAPs), were observed by means of atomic force microscopy and by imaging ...
Sol-gel processing parameters of Pb0.99Zr0.55Sn0.37Ti0.06Nb0.02O3 thin films were studied. Effects of H2O, HNO3 and formamide additives on solution gelation and film properties were investigated. Thin films were prepared on Ti/Pt and Ta/Pt metallized Si su ...
Rhombohedral Pb(Zr0.70Ti0.30)O-3 thin films of four different well-defined textures, namely, (100), (111), bimodal (110)/(111), and (100)/(111), were prepared by a sol-gel method. The films were characterized in terms of grain size, presence of second phas ...
