Predicting the yield stress of paraffin-wax suspensions
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Numerous evidence suggests that thick-film resistors are close to a metal– insulator transition and that tunneling processes between metallic grains are the main source of resistance. By theoretical analysis of various percolative resistor network models w ...
We re-analyse earlier measurements of resistance R and piezoresistance K in RuO2-based thick-film resistors (TFRs). The percolating nature of transport in these systems is well accounted by values of the transport exponent t larger than its universal value ...
We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated m ...
The authors present the percolation and electronic properties of (Y1Ba2Cu3O7-δ)1-xAgx compounds in which silver fills the intergranular space without reducing Tc, which remains at 92±1 K. Normal-state resistivity is decreased by up to two orders of magnitu ...
Thick-film resistors (TFRs) consist of a percolating network of conducting oxide nanoparticlesdispersed in an insulating glassy matrix, whose resistive properties are dominated by quantumtunneling across insulating layers separating adjacent conducting gra ...
Requiring all nodes of a wireless multihop network to be connected is expensive and results in a poor scalability of properties such as transport capacity. We show however that it is no longer the case if we only slightly loosen the connectivity requiremen ...
