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Synchronization of nanomechanical oscillators

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This article presents a 4-to-5 GHz LC oscillator operating at 4.2K for quantum computing applications. The phase noise (PN) specification of the oscillator is derived based on the control fidelity for a single-qubit operation. To reveal the substantial gap ...

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A Delta Sigma-Modulated Sample and Average Common-Mode Feedback Technique for Capacitively Coupled Amplifiers in a 192-nW Acoustic Analog Front-End

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This work presents an acoustic analog front-end based on a delta sigma-modulated sample and average common-mode feedback technique. The proposed feedback offers a process and temperature stable high pass (HP) frequency corner, unity dc feedback gain, and a ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2022

Strained crystalline nanomechanical resonators with quality factors above 10 billion

Tobias Kippenberg, Alberto Beccari, Nils Johan Engelsen, Sergey Fedorov

In strained mechanical resonators, the concurrence of tensile stress and geometric nonlinearity dramatically reduces dissipation. This phenomenon, called dissipation dilution, is employed in mirror suspensions of gravitational-wave interferometers and at t ...

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Development of Lamb wave resonators in thin film X-cut lithium niobate

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Microelectromechanical systems (MEMS) is among the most revolutionary technologies of 21st century, with the applications ranging from industrial systems to consumer electronics. Using MEMS in battery-powered wireless devices has long been seen as the evol ...

EPFL2021

Evidence of Smaller 1/F Noise in AlScN-Based Oscillators Compared to AlN-Based Oscillators

Luis Guillermo Villanueva Torrijo, Marco Liffredo, Andrea Lozzi

In this paper we investigate the direct effect of resonator quality factor (Q) on the oscillator phase noise. We use 2-port contour mode resonators (CMRs), fabricated both with aluminum nitride (AlN) and aluminum scandium nitride (AlScN), as the frequency- ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2020

Resonant sensors based on micro- and nano-electro mechanical systems (M/NEMS) are ubiquitous in many sensing applications due to their outstanding performance capabilities, which are directly proportional to the quality factor (Q) of the devices. We addres ...

2020

Phase Noise Measurements Of Aluminum Scandium Nitride Oscillators

Luis Guillermo Villanueva Torrijo, Marco Liffredo, Andrea Lozzi

This paper presents the first phase noise (PN) measurements of oscillators based on aluminum scandium nitride (AlScN) resonators. 2-port AlScN contour mode resonators (CMR) operating at 195 MHz arc fabricated. A large pool of Q values (ranging from 150 to ...

IEEE2019

Miniaturization is a simple yet very powerful concept. Applied to devices, it opens to plethora of new applications. Microelectromechanical systems (MEMS) are the result of scaling down the dimensions of devices to the micron range or the nano range (NEMS) ...

EPFL2019

Clamp-Tapering Increases the Quality Factor of Stressed Nanobeams

Tobias Kippenberg, Alberto Beccari, Dalziel Joseph Wilson, Nils Johan Engelsen, Sergey Fedorov, Ryan Daniel Schilling, Amir Hossein Ghadimi

Stressed nanomechanical resonators are known to have exceptionally high quality factors (Q) due to the dilution of intrinsic dissipation by stress. Typically, the amount of dissipation dilution and thus the resonator Q is limited by the high mode curvature ...

AMER CHEMICAL SOC2019