Publication

Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy

Résumé

Nearly all scanning probe microscopes (SPMs) contain a feedback controller, which is used to move the scanner in the direction of the z-axis in order to maintain a constant setpoint based on the tip-sample interaction. The most frequently used feedback controller in SPMs is the proportional-integral (PI) controller. The bandwidth of the PI controller presents one of the speed limiting factors in high-speed SPMs, where higher bandwidths enable faster scanning speeds and higher imaging resolution. Most SPM systems use digital signal processor-based PI feedback controllers, which require analog-to-digital and digital-to-analog converters. These converters introduce additional feedback delays which limit the achievable imaging speed and resolution. In this paper, we present a digitally controlled analog proportional-integral-derivative (PID) controller. The controller implementation allows tunability of the PID gains over a large amplification and frequency range, while also providing precise control of the system and reproducibility of the gain parameters. By using the analog PID controller, we were able to perform successful atomic force microscopy imaging of a standard silicon calibration grating at line rates up to several kHz.

À propos de ce résultat
Cette page est générée automatiquement et peut contenir des informations qui ne sont pas correctes, complètes, à jour ou pertinentes par rapport à votre recherche. Il en va de même pour toutes les autres pages de ce site. Veillez à vérifier les informations auprès des sources officielles de l'EPFL.
Concepts associés (32)
Closed-loop controller
A closed-loop controller or feedback controller is a control loop which incorporates feedback, in contrast to an open-loop controller or non-feedback controller. A closed-loop controller uses feedback to control states or outputs of a dynamical system. Its name comes from the information path in the system: process inputs (e.g., voltage applied to an electric motor) have an effect on the process outputs (e.g., speed or torque of the motor), which is measured with sensors and processed by the controller; the result (the control signal) is "fed back" as input to the process, closing the loop.
Microscope à force atomique
thumb|350px|Le premier microscope à force atomique du monde, au musée de la Science de Londres. Le microscope à force atomique (AFM pour atomic force microscope) est un type de microscope à sonde locale permettant de visualiser la topographie de la surface d'un échantillon. Inventé en 1985, par Gerd Binnig, Calvin Quate et Christoph Gerber, ce type de microscopie repose essentiellement sur l'analyse d'un objet point par point au moyen d'un balayage via une sonde locale, assimilable à une pointe effilée.
Microscopie à sonde locale
La microscopie à sonde locale (MSL) ou microscopie en champ proche (MCP) ou scanning probe microscopy (SPM) en anglais est une technique de microscopie permettant de cartographier le relief (nano-topographie) ou une autre grandeur physique en balayant la surface à imager à l'aide d'une pointe très fine (la pointe est idéalement un cône se terminant par un seul atome). Le pouvoir de résolution obtenu par cette technique permet d'observer jusqu'à des atomes, ce qui est physiquement impossible avec un microscope optique, quel que soit son grossissement.
Afficher plus
Publications associées (54)

Compact and effective photon-resolved image scanning microscope

Giorgio Tortarolo

Fluorescence confocal laser-scanning microscopy (LSM) is one of the most popular tools for life science research. This popularity is expected to grow thanks to single-photon array detectors tailored for LSM. These detectors offer unique single-photon spati ...
Spie-Soc Photo-Optical Instrumentation Engineers2024

Advances in High-Speed, Multiparametric Atomic Force Microscopy

Santiago Harald Andany

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...
EPFL2024

Closed-loop technique based on gain balancing for real-time Brillouin optical time-domain analysis

Luc Thévenaz, Zhisheng Yang, Li Zhang, Ana Gabriela Correa Mena

A closed-loop servo control based on balancing the gain of two probing frequencies is proposed for real-time Brillouin optical time-domain analysis (BOTDA) without post-processing. With the most basic BOTDA hardware setup, the system can perform measuremen ...
2022
Afficher plus
MOOCs associés (13)
Micro and Nanofabrication (MEMS)
Learn the fundamentals of microfabrication and nanofabrication by using the most effective techniques in a cleanroom environment.
Microstructure Fabrication Technologies I
Learn the fundamentals of microfabrication and nanofabrication by using the most effective techniques in a cleanroom environment.
Micro and Nanofabrication (MEMS)
Learn the fundamentals of microfabrication and nanofabrication by using the most effective techniques in a cleanroom environment.
Afficher plus

Graph Chatbot

Chattez avec Graph Search

Posez n’importe quelle question sur les cours, conférences, exercices, recherches, actualités, etc. de l’EPFL ou essayez les exemples de questions ci-dessous.

AVERTISSEMENT : Le chatbot Graph n'est pas programmé pour fournir des réponses explicites ou catégoriques à vos questions. Il transforme plutôt vos questions en demandes API qui sont distribuées aux différents services informatiques officiellement administrés par l'EPFL. Son but est uniquement de collecter et de recommander des références pertinentes à des contenus que vous pouvez explorer pour vous aider à répondre à vos questions.