Publication

A monolithic MEMS position sensor for closed-loop high-speed atomic force microscopy

Publications associées (33)

Advances in High-Speed, Multiparametric Atomic Force Microscopy

Santiago Harald Andany

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...
EPFL2024

Revealing the Mechanism Underlying 3D-AFM Imaging of Suspended Structures by Experiments and Simulations

Marcos Penedo Garcia

The invention of 3D atomic force microscopy (3D-AFM) has enabled visualizing subnanoscale 3D hydration structures. Meanwhile, its applications to imaging flexible molecular chains have started to be experimentally explored. However, the validity and princi ...
Wiley-V C H Verlag Gmbh2024

Atomic-scale Characterization of Strain and Gate effects on Two-dimensional Materials by Scanning Tunneling Microscopy

Jz -Yuan Juo

Strain is an inevitable phenomenon in two-dimensional (2D) material, regardless of whether the film is suspended or supported. Moreover, strain is known to alter the physical and chemical properties, such as the band gap, charge carrier effective masses, d ...
EPFL2023

Computed Three-Dimensional Atomic Force Microscopy Images of Biopolymers Using the Jarzynski Equality

Marcos Penedo Garcia

Three-dimensional atomic force microscopy (3D-AFM) has resolved three-dimensional distributions of solvent molecules at solid-liquid interfaces at the subnanometer scale. This method is now being extended to the imaging of biopolymer assemblies such as chr ...
AMER CHEMICAL SOC2022

Polysulfone Dispersed Liquid Crystals As Promising Materials For Flexible Substrates Of Organic Light Emitting Diodes

Maria-Alexandra Paun

The paper deals with the preparation and investigation of a series of polymer dispersed liquid crystals (PDLCs) based on polysulfone matrix and an azomethine liquid crystal. The PDLC systems were prepared by thermal induced phase separation method. Their m ...
UNIV POLITEHNICA BUCHAREST, SCI BULL2021

Single channel Josephson effect in a high transmission atomic contact

Klaus Kern, Markus Etzkorn, Jacob Senkpiel

The Josephson effect in scanning tunneling microscopy (STM) is an excellent tool to probe the properties of a superconductor on a local scale. We use atomic manipulation in a low temperature STM to create mesoscopic single channel contacts and study the Jo ...
NATURE PUBLISHING GROUP2020

High-quality single crystal diamond diffraction gratings fabricated by crystallographic etching

Olivier Martin, Niels Quack, Christian Santschi, Toralf Scharf, Teodoro Graziosi

We demonstrate a novel method for fabricating single crystal diamond diffraction gratings based on crystallographic etching that yields high-quality diffraction gratings from commercially available diamond plates. Both V-groove and rectangular gratin ...
2019

Band Gap of Atomically Precise Graphene Nanoribbons as a Function of Ribbon Length and Termination

Christoph Leopold Talirz, Daniele Passerone

We study the band gap of finite NA=7 armchair graphene nanoribbons (7-AGNRs) on Au(111) through scanning tunneling microscopy/spectroscopy combined with density functional theory calculations. The band gap of 7-AGNRs with lengths of 8 nm and more is conver ...
WILEY-V C H VERLAG GMBH2019

Scanning Probe-Directed Assembly and Rapid Chemical Writing Using Nanoscopic Flow of Phospholipids

Vytautas Navikas

Nanofluidic systems offer a huge potential for discovery of new molecular transport and chemical phenomena that can be employed for future technologies. Herein, we report on the transport behavior of surface-reactive compounds in a nanometer-scale flow of ...
AMER CHEMICAL SOC2019

Advances in High-Speed Atomic Force Microscopy

Adrian Pascal Nievergelt

High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...
EPFL2018

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