Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging
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In this paper, we obtain a family of lower bounds for the sum capacity of code-division multiple-access (CDMA) channels assuming binary inputs and binary signature codes in the presence of additive noise with an arbitrary distribution. The envelope of this ...
Institute of Electrical and Electronics Engineers2009
We present noise and distortion measurements of multicast copies generated in a self-seeded parametric mixer. Linear mixer operation is achieved by distortion-free Brillouin suppression resulting in high signal-to-noise and distortion-ratio (SINAD) wavelen ...
Institute of Electrical and Electronics Engineers2011
This paper develops a new communication strategy, ergodic interference alignment, for the K-user interference channel with time-varying fading. At any particular time, each receiver will see a superposition of the transmitted signals plus noise. The standa ...
Institute of Electrical and Electronics Engineers2012
By ignoring events originating in noisy areas of a position-sensitive single-photon avalanche diode (SPAD), reduction of noise from fixed-position defects is experimentally shown. Additional experimental results from a position-sensitive SPAD integrated in ...
This paper compares the use of perceived and measured noise in a hedonic housing model. Although in theory the use of subjective variables is recommended, most empirical applications use measured noise variables. Merging different databases, we obtain a sa ...
Comprehensive analysis of noise sources in photocharge detectors leads to two novel, compact pixel circuits for ultra-low-noise light detection using optimum bandwidth engineering. A synchronous 4T CMOS image sensor pixel with in-pixel amplification reache ...
We present a programmable microcontroller-driven injection system for the exchange of imaging medium during atomic force microscopy. Using this low-noise system, high-resolution imaging can be performed during this process of injection without disturbance. ...
In this work we present the development of a new set-up that allows on-wafer sensitivity characterization of piezoresistive cantilevers. In this way we reduce considerably the testing time compared to the techniques available up to date but at the same tim ...
This paper presents a MEMS-based 5th-order Delta Sigma capacitive accelerometer. The Delta Sigma loop is implemented in mixed signal, the global 5th-order filter having a 2nd-order analog and a 3rd-order digital part. The system can be used with a wide ran ...
Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2011
This paper presents a 5th-order ΔΣ capacitive accelerometer. The ΔΣ loop is implemented in mixed signal, the global 5th-order filter having a 2nd-order analog and a 3rd-order digital part. The system can be used with a wide range of sensors, because the mi ...
Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2009
