We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
Christoph Bostedt, Alessandro Colombo, Giorgio Rossi
Francesco Stellacci, Stefan Guldin, Ye Yang, Zhi Luo, Huayan Yang