A Compressive Sensing Framework for EMI Source Localization Using a Metalens Structure: Localization Beyond the Diffraction Limit

In this article, we propose a novel approach for the localization of electromagnetic interference (EMI) sources based on the concept of compressive sensing and metalenses. We show that using the spatial and frequency dispersion offered by the metalens, we can create a scanning beam to provide an image of the current distribution in a printed circuit board. We deployed a computational imaging framework to extract the information in the observation plane of the imaging system and thus obtain the location of the EMI source. To use mode diversity offered by the metalens, we suggest using the compressive sensing platform. To the authors’ best knowledge, this is the first utilization of metalenses, computational imaging, and compressive sensing to locate EMI sources. Numerical simulation is used to implement and investigate the ability of the proposed approach to localized EMI sources. The obtained results show a very accurate localization skill. The proposed approach overcomes the diffraction limit and provides λ /17 superresolution. Moreover, the proposed approach uses a single stationary antenna to collect data and does not need either mechanical scanning, which is time consuming, or a beamforming array, which is expensive.