Physico-chemical study of the focused electron beam induced deposition process
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In the present article we describe a new setup for an atomic force microscope in the beetle-type geometry. The microscope consists of a compact head standing on three piezo legs with a fourth central piezo carrying the cantilever tip. We use the laser beam ...
We use the cathodoluminescence mode of a scanning electron microscope to investigate the depth and lateral dependencies of the electron-hole pairs generation by the electron beam in Al0.4Ga0.6As semiconducting material. A multiquantum well structure acts a ...
We have investigated the optical and structural properties of tensile-strained GaxIn1-xP/InP heterojunctions by cathodoluminescence (CL) in the scanning electron microscope and by transmission electron microscopy (TEM). The lattice mismatch of the samples ...
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An energy filter receiving an electronic beam oriented along an optical axis. The filter includes a deflecting system which deviates in a dispersion plane not including the optical axis the received beam and a dispersing system which guides the beam sent b ...
THE formation of nanometre-scale surface structures by atomic manipulation with the scanning tunneling microscope has opened up opportunities for creating new metastable states of matter atom by atom1. The technique allows the fabrication of arbitrary stru ...
The parallel velocity distribution function of the weakly relativistic electron beam of a quasi-optical gyrotron has been determined by measuring the Doppler-shifted Electron Cyclotron Emission (ECE) at an angle theta=15 degrees with respect to the externa ...
The cathodoluminescence mode of the scanning electron microscope is used for the first time to investigate the lateral dependence of the electron-hole pair generation by the electron beam of the scanning electron microscope m semiconducting material. A mul ...
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We present the first results from the upgraded version of the scanning photoemission spectromicroscope MAXIMUM, bared on synchrotron undulator fight and on a multilayer-coated Schwarzschild objective. The upgrade involved nearly all parts of the instrument ...