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After assessing the current status concerning the interpretation of Si 2p core-level shifts in Si-O systems, we model the atomic structure of the Si(001)-SiO2 interface using recent photoemission data obtained with synchrotron radiation. Our model structur ...
The characteristics of synchrotron X-ray sources-quite different from those of conventional sources-are exploited by several new imaging techniques. These techniques expand the capabilities of conventional radiology and find interesting application in spec ...
We show that photoelectron spectromicroscopy with synchrotron radiation has been successfully exported from materials science to the life sciences. The transfer is well beyond mere feasibility tests. Photoelectron spectromicroscopy is in fact used for real ...
The free-electron laser (FEL) has become an important tool for producing high-intensity photon beams, especially in the infrared. Synchrotron radiation's primary spectral domains are in the ultraviolet and X-ray region. FEL's are therefore excellent compli ...
High-purity copper samples were irradiated with high-energy protons and neutrons, The concentration of transmutational elements was measured by means of the total reflection x-ray fluorescence method using synchrotron radiation, The spectra of non-irradiat ...
Synchrotron light is usually treated with a rather complicated electrodynamics formalism. However. its basic properties can be easily understood with a simple approach based on the classical emission of electromagnetic radiation by an accelerated charge in ...
Only three weeks after the beginning of commissioning, the new ultrabright synchrotron source ELETTRA was able to deliver the first experimental test data. We briefly discuss these test experiments, which produced a series of photoelectron micrographs of d ...
Coherent x-rays are here! This exciting news is a byproduct of the effort to increase the brightness of synchrotron light sources. We discuss the basic issues concerning x-ray coherence, and some of the applications that are already underway - with particu ...
We report a study of the lateral band bending at the Ge-GaSe interface. Spectromicroscopy measurements with synchrotron radiation were performed at the ESCA microscopy line of ELETTRA in Ge patterned films on GaSe substrates. Preliminary results of lateral ...
