This lecture covers the interactions between beams and matter, focusing on the emission phenomena resulting from the ionization of core electrons by X-Rays and electrons. It explains the emission of photo-electrons and secondary electrons, the relaxation processes leading to X-Rays and Auger electrons emission, and the competition between Auger and X-Rays emissions. Additionally, it discusses the analytical techniques based on photon and electron interactions with matter, such as X-Ray fluorescence and Auger electron spectrometry. The lecture also delves into the detectors used for analyzing X-Rays and electrons emissions, including gas detectors, scintillation solid detectors, and semiconductor solid detectors.