Surface Characterization: X-ray Photoelectron Spectroscopy

This lecture covers the principles and applications of surface characterization techniques, focusing on X-ray Photoelectron Spectroscopy (XPS). It starts with the discovery of X-rays by Wilhelm Roentgen and the photoelectric effect explained by Einstein. The lecture then delves into the Siegbahn family's contributions to XPS, the course plan for XPS, and the role of surfaces and interfaces in various fields. It discusses the depth of a surface, surfaces towards the nanoscale, and how to probe a surface using XPS. The importance of energy referencing, the Fermi level, and the interaction of X-rays with matter are also explained.