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This lecture covers the basics of Electron Backscatter Diffraction (EBSD), including sample preparation, acquisition of EBSD patterns, Hough transform, and data analysis techniques. It explores the uses of EBSD for orientation measurements, phase identification, and quantitative microstructural data in various materials. The lecture also delves into the influence of accelerating voltage, spatial and angular accuracy, and applications of EBSD in crystallography. Practical aspects such as indexing of EBSPs, phase identification, and data analysis with orientation representations are discussed in detail.