PVT Variations, Uncertainty, and Monte-Carlo Simulations

In course

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Description

This lecture covers the impact of PVT variations on integrated circuits, emphasizing the uncertainties in IC design due to process, voltage, and temperature variations. It discusses the challenges of variability, worst-case design paradigms, spatial and temporal correlations of variations, and the importance of Monte-Carlo simulations in estimating parametric yield. The instructor explains the significance of global operating corners, the limitations of binning for general-purpose computing, and the analysis of very high yield using Monte-Carlo simulations.

Instructor

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Official source

https://mediaspace.epfl.ch/media/0_ai5rd3fe

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Ontological neighbourhood

Computer engineering

Hardware engineering: Application-specific integrated circuit, Microprocessors

Statistics

Statistical inference: Mathematical statistics

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