Surface Analysis: SIMS Examples

In course

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Description

This lecture covers examples of surface analysis using Time-of-Flight Secondary Ion Mass Spectrometry (SIMS). It includes topics such as segregation in a Cu-Pb Bi alloy, cleaning of surfaces, and depth profiling of multilayer materials. The instructor discusses the experimental methods, analytical results, and conclusions drawn from the SIMS analysis.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_c0pbsidm

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