Radiation Effects on Microelectronics

This lecture covers the impact of ionising radiation on microelectronics, including total ionising dose effects, single event effects, and mitigation techniques. Topics include TID accumulation, device parameter variations, CMOS circuit effects, and strategies to harden microelectronics against radiation. The instructor discusses the vulnerability of semiconductor structures to radiation, the development of radiation-hardened components, and the importance of mitigation techniques in spacecraft avionics systems.