Nanoparticles: SEM and EDX Analysis

This lecture covers the use of Scanning Electron Microscopy (SEM) for measuring particle size, visualizing surface topology, and characterizing chemical composition with Energy Dispersive X-ray Analysis (EDX). It explains the detection of backscattered and secondary electrons, as well as Auger electrons, in SEM. The lecture also discusses Transmission Electron Microscopy (TEM) for sizing nanoparticles, determining crystal structure, and visualizing block-copolymer arrangements. It explores the assembly of colloidal crystals, the Marangoni effect in particle assembly, and the coffee ring effect. Additionally, it delves into the formation of colloidal crystals, maximum packing density, and agglomeration of particles through depletion forces and diffusion-limited processes.