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This lecture covers the basics of Electron Backscatter Diffraction (EBSD) and Environmental Scanning Electron Microscopy (ESEM). Topics include EBSD acquisition, sample preparation, indexing of EBSPs, Hough transform, applications of EBSD, and data analysis. The lecture also delves into the operation and advantages of ESEM, such as imaging in various environments and the use of secondary electron detection.
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