Lecture

Transmission Electron Microscopy Basics

Description

This lecture covers the fundamentals of Transmission Electron Microscopy (TEM), including topics such as TEM user interface, camera settings, frame integration, vacuum overview, high tension adjustments, and image analysis. It also explains the process of aligning the beam center, adjusting lenses, and optimizing image quality.

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Official source

https://mediaspace.epfl.ch/media/0_zjmyv3fn

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Ontological neighbourhood

Physics

Optics: Photography

Mathematics

Analysis: Complex analysis

Algebra: Linear algebra

Electrical engineering

Electronic engineering: Consumer electronics

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