Publication
First experiments at the Vanderbilt free electron lasers measured the local reflectivity of a PtSi/Si system. The reflectivity in the scanning near-field optical microscope images revealed features that were not present in the corresponding shear-force (topology) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached. The use of different photon wavelengths (0.653, 1.2, and 2.4 mu m) enabled us to probe regions of different depth. (C) 1998 American Institute of Physics.
Alessio Ferrari, Eleni Stavropoulou, Fabiana Sannasardo