Secondary emission | EPFL Graph Search

In particle physics, secondary emission is a phenomenon where primary incident particles of sufficient energy, when hitting a surface or passing through some material, induce the emission of secondary particles. The term often refers to the emission of electrons when charged particles like electrons or ions in a vacuum tube strike a metal surface; these are called secondary electrons. In this case, the number of secondary electrons emitted per incident particle is called secondary emission yield. If the secondary particles are ions, the effect is termed secondary ion emission. Secondary electron emission is used in photomultiplier tubes and tubes to amplify the small number of photoelectrons produced by photoemission, making the tube more sensitive. It also occurs as an undesirable side effect in electronic vacuum tubes when electrons from the cathode strike the anode, and can cause parasitic oscillation. Commonly used secondary emissive materials include alkali antimonide Beryllium oxide (BeO) Magnesium oxide (MgO) Gallium phosphide (GaP) Gallium arsenide phosphide (GaAsP) Lead oxide (PbO) In a photomultiplier tube, one or more electrons are emitted from a photocathode and accelerated towards a polished metal electrode (called a dynode). They hit the electrode surface with sufficient energy to release a number of electrons through secondary emission. These new electrons are then accelerated towards another dynode, and the process is repeated several times, resulting in an overall gain ('electron multiplication') in the order of typically one million and thus generating an electronically detectable current pulse at the last dynodes. Similar electron multipliers can be used for detection of fast particles like electrons or ions. In the 1930s special amplifying tubes were developed which deliberately "folded" the electron beam, by having it strike a dynode to be reflected into the anode. This had the effect of increasing the plate-grid distance for a given tube size, increasing the transconductance of the tube and reducing its noise figure.

A comprehensive analysis of electron emission from a-Si:H/Al2O3 at low energies

Christophe Ballif, Jonathan Emanuel Thomet, Janina Christine Isabelle Löffler, Samira Alexandra Frey, Mohamed Belhaj

Recently developed microchannel plates (MCPs) based on amorphous silicon offer potential advantages with respect to glass based ones. In this context, secondary electron emission (SEE) at very low energies below 100 eV has been studied for relevant materia ...

IOP Publishing Ltd2023

Generation and control of localized terahertz fields in photoemitted electron plasmas

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Dense micron-sized electron plasmas, such as those generated upon irradiation of nanostructured metallic surfaces by intense femtosecond laser pulses, constitute a rich playground to study light-matter interactions, many-body phenomena, and out-of-equilibr ...

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Charge Dynamics Electron Microscopy Nanoscale Imaging of Femtosecond Plasma Dynamics

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Understanding and actively controlling the spatiotemporal dynamics of nonequilibrium electron clouds is fundamental for the design of light and electron sources, high power electronic devices, and plasma-based applications. However, electron clouds evolve ...

AMER CHEMICAL SOC2023