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Course
MSE-609: 21Intro Scanning electron microscopy techniques
Summary
Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.
Official source
Moodle Page
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