MSE-609: 21Intro Scanning electron microscopy techniques

Summary

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.

Official source

https://edu.epfl.ch/coursebook/en/21intro-scanning-electron-microscopy-techniques-MSE-609

Moodle Page

http://go.epfl.ch/MSE-609

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