Covers the basics of image acquisition, including optical devices, resolution factors, lens distortions, and sensor technologies.
Introduces camera calibration basics, including parameters estimation, pinhole model limitations, lens imaging, depth of field, and lens distortions.
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Covers the basics of a pinhole camera and the impact of changing parameters on image quality.
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
Covers the 2x2 transfer matrix for optical systems and the characterization using height and angle parameters, along with lens systems and entrance pupils.
