Electron Microscope Components

This lecture covers the components of an electron microscope, including electron-matter interactions, types of electron microscopes (SEM, TEM), vacuum systems, electron guns, lenses, and detectors. It explains the functioning of semiconductor detectors, scintillator-photomultiplier detectors, CCDs, CMOS, and direct electron detectors. The lecture also discusses aberrations in electron optics, such as spherical aberration and astigmatism, and the importance of optimal aperture size. Additionally, it delves into the various imaging modes in TEM, the role of lenses in focusing the electron beam, and the significance of specimen holders in TEM. The content emphasizes the critical concepts and technologies used in electron microscopy.