Concept

Low-voltage electron microscope

Related publications (307)

High Precision Robotics System for Scanning Electron Microscopes

In this paper we present our latest developments in high precision positioning and handling systems operating inside an SEM. The Laboratory in Scanning Electron Microscope concept (LAB-in-SEM) is proposed along with a description of our piezodriven manipul ...

2004

Spontaneous assembly of subnanometre-ordered domains in the ligand shell of monolayer-protected nanoparticles

Francesco Stellacci

The properties of materials can be created and improved either by confining their dimensions in the nanoscale or by controlling their nanostructure. We have combined these two concepts, and here we describe a new class of nanostructured nanosized materials ...

2004

Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Cécile Hébert

Electron energy-loss near-edge structure data for the N K and the Cr L 2,3 edges of CrN and Cr2N have been acquired in order to distinguish between these chromium nitride modifications. The N K edge spectra of these compounds have been modelled using both ...

2004

Direct observation of the B-site cationic order in the ferroelectric relaxor Pb(Mg1/3Ta2/3)O-3

Nava Setter, Marco Cantoni

By means of transmission electron microscopy (TEM) the structure of chemically ordered regions in Zr-doped Pb(Mg1/3Ta2/3)O-3 has been studied. Large coherent ordered domains were obtained by the addition of 5 mol% PbZrO3. The results obtained by convention ...

2004

Identification of nano-phases: relative merit of local analysis techniques (HRTEM, nanodiffraction, EDS/EELS)

Philippe Buffat

Information for phase identification may be gathered in the electron transmission microscope with spatial resolution down to the nanometre scale. Energy dispersive X-ray and electron energy loss spectrometries are based on inelastic electron/sample interac ...

2004

Identification of nano-phases: relative merit of local analysis techniques (HRTEM, nanodiffraction, EDS/EELS)

Philippe Buffat

European Microscopy Society2004

Automated wafer-scale fabrication of electron beam deposited tips for atomic force microscopes using pattern recognition

Georg Fantner

We present an automation technique for the growth of electron beam deposited tips on whole wafers of atomic force microscope cantilevers. This technique uses pattern recognition on scanning electron microscope images of successive magnifications to precise ...

2004

Reinforcement of single-walled carbon nanotube bundles by intertube bridging

Jürgen Brugger, László Forró, Andras Kis, Andrzej Kulik, Willy Benoit

During their production, single-walled carbon nanotubes form bundles. Owing to the weak van der Waals interaction that holds them together in the bundle, the tubes can easily slide on each other, resulting in a shear modulus comparable to that of graphite. ...

2004

The sol-gel process for realisation of optical micro-structures in glass

Martinus Gijs, Abdeljalil Sayah, Virendra Kumar Parashar

We have applied the sol-gel process to generate optical microstructures in glass using in-house developed sol-gel materials. The synthesis of our sol-gel glass materials is based on the formation of particles of controlled size from organo-metallic compoun ...

2004

Observation of fracture and plastic deformation during indentation and scratching inside the scanning electron microscope

Franz-Josef Haug, Johann Michler, Jean-Marc Breguet

During nanoindentation measurements of thin films the formation of cracks within the film as well as of pile-up or sink-in around the indent are known to affect significantly the precision of hardness and Young's modulus values. The crack pattern in brittl ...

2004

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