Concept

Scanning tunneling microscope

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BIO-614: Practical - Antanasijevic Lab

The students will learn:

how to handle viral protein antigens and antibody samples
how to assemble and purify immune complexes using liquid chromatography
how to image them on an electron

CH-410: Physical and chemical analyses of materials

The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials.

PHYS-637: Electron Matter Interactions in Transmission Electron Microscopy

This course will present the fundamentals of electronâmatter interactions, as occuring in the energy range available in modern transmission electron microscopes, namely 60-300 keV electrons. Diffrac

MSE-450: Electron microscopy: advanced methods

With this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data.

MSE-715: Fundamentals of STEM lmaging and Spectroscopy

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-co

MICRO-428: Metrology

The course deals with the concept of measuring in different domains, particularly in the electrical, optical, and microscale domains. The course will end with a perspective on quantum measurements, wh

CH-341: Physical chemistry of interfaces

Acquire an understanding of interfacial phenomena, micro-heterogeneous colloidal solution systems and dynamic electrochemistry.

PHYS-627: Magnetic and semiconducting nanostructures

Introduce students to the magnetic and electronic properties of nanostructures

MSE-670: Advanced Microscopy for Magnetic Materials

Theoretical and practical expertise is gained about the microscopy of spin structures and magnetic configuiations down to the sub-nm length and sub-ns time scales such as transmission electron microsc

MSE-659: Introduction to scanning electron microscopy microanalysis techniques

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists