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Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Explores in-situ and ultrafast Lorentz Transmission Electron Microscopy, covering dynamic imaging, observing atoms, charges, spins, lattice dynamics, magnetic skyrmions, and coherent control using laser pulses.
Covers fundamental characterization approaches for solid materials, focusing on elemental analysis, thermal analysis, microscopy, and neutron-based spectroscopies.
Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.
