Transmission Electron Microscopy

This lecture covers the principles and applications of Transmission Electron Microscopy (TEM), including TEM imaging, diffraction, high-resolution TEM, Scanning TEM (STEM), and Energy-dispersive X-ray (EDX) analysis. It explores the interaction of electrons with matter, electron diffraction, image formation, contrast mechanisms, and Cs-aberration correction for HR-TEM. The lecture also delves into Electron Energy-Loss Spectroscopy (EELS), in situ TEM techniques, and electron tomography for 3D reconstructions. Various examples are provided, such as diffraction contrast imaging, Fresnel fringes, and STEM-EDX mapping. The advantages and disadvantages of in situ TEM, including straining, deformation, and mechanical manipulation, are discussed, along with the study of irradiation, melting, and solidification processes.

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State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Cryogenic electron microscopy

Cryogenic electron microscopy (cryo-EM) is a cryomicroscopy technique applied on samples cooled to cryogenic temperatures. For biological specimens, the structure is preserved by embedding in an environment of vitreous ice. An aqueous sample solution is applied to a grid-mesh and plunge-frozen in liquid ethane or a mixture of liquid ethane and propane. While development of the technique began in the 1970s, recent advances in detector technology and software algorithms have allowed for the determination of biomolecular structures at near-atomic resolution.

Transmission electron cryomicroscopy

Transmission electron cryomicroscopy (CryoTEM), commonly known as cryo-EM, is a form of cryogenic electron microscopy, more specifically a type of transmission electron microscopy (TEM) where the sample is studied at cryogenic temperatures (generally liquid-nitrogen temperatures). Cryo-EM is gaining popularity in structural biology. The utility of transmission electron cryomicroscopy stems from the fact that it allows the observation of specimens that have not been stained or fixed in any way, showing them in their native environment.

Advanced TEM Operation

Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.

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Electron Microscopy Components MSE-352: Introduction to microscopy + Laboratory work

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Electron Diffraction: Basics & Applications MSE-352: Introduction to microscopy + Laboratory work

Explores electron diffraction basics, including Bragg's law, reciprocal lattice, and applications like crystal phase discrimination.

Electron Microscopy: TEM MSE-352: Introduction to microscopy + Laboratory work

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.