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Related lectures (26)
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Inspection and Metrology: Electron Microscopy
Explores the principles and applications of scanning electron microscopy in micro and nanofabrication, covering electron signals, charging issues, and dimensional measurements.
Spin Ensembles: Collective Effects and Quantum Metrology
Explores spin ensembles' collective effects and quantum metrology applications, covering Dicke states, polaritons, coherent spin states, and angular momentum properties.
Electrical Metrology: Noise Reduction Techniques
Explores noise reduction techniques in electrical metrology, covering properties of charge, current, voltage, noise sources, and filtering methods.
Lithography: Scanning Probe Lithography
Delves into scanning probe lithography, exploring its principles and potential applications in nano-fabrication.
Electrical Metrology: Noise and Signal Analysis
Explores electrical metrology, emphasizing noise and signal analysis, covering topics such as charges, currents, voltages, and various noise sources.
Quantum Metrology: Fundamentals and Applications
Explores quantum metrology fundamentals, applications, and technologies like quantum ghost imaging, computing, and key distribution.
