Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
Explores the roles of testing in VLSI systems, different testing methodologies, cost analysis, factors affecting yield, and the importance of testing in modern technologies.
Covers Lorentz Transmission Electron Microscopy and its role in analyzing magnetic domain structures and properties through various imaging modes and quantitative methods.
Explores defect creation in large area electronic materials, focusing on amorphous silicon and discussing doping efficiency, estimated defect density, and light-induced defects.
