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Testing of VLSI Systems
This lecture covers the roles of testing in VLSI systems, including detection, diagnosis, failure mode analysis, and the impact of real tests not being perfect. It also explains the testing process within IC fabrication steps, types of manufacturing tests, and the use of Automatic Test Equipment (ATE). The lecture delves into different testing methodologies such as characterization, Go/No-Go, burn-in, and incoming inspection. It discusses the cost analysis of production tests, factors affecting yield, defect level, fault coverage, and the increasing importance of testing in modern technologies.