Course

MSE-675: Introduction to SEM and FIB microanalysis

Summary

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Official source

https://edu.epfl.ch/coursebook/en/introduction-to-sem-and-fib-microanalysis-MSE-675

Moodle Page

http://go.epfl.ch/MSE-675

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Instructors (2)

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