MSE-704: 3D Electron Microscopy and FIB-Nanotomography

Summary

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.

Official source

https://edu.epfl.ch/coursebook/en/3d-electron-microscopy-and-fib-nanotomography-MSE-704

Moodle Page

http://go.epfl.ch/MSE-704

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Instructors (2)

Lectures in this course (9)

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