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Course
MSE-735: Scanning and Analytical Transmission Electron Microscopy
Summary
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.
Official source
Moodle Page
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