Synchrotron-Based Spectroscopic Techniques

Analytical Electron Microscopy: Spectroscopy and Microanalysis

Explores Analytical Electron Microscopy techniques for chemical analysis using EELS and EDX.

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Characterization Approaches for Solid Materials

Covers fundamental characterization approaches for solid materials, focusing on elemental analysis, thermal analysis, microscopy, and neutron-based spectroscopies.

Chemical analysis: X-Ray photoelectron spectrometry

Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.