Microscopy Resolution: Understanding Rayleigh Criteria

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Explores spatial frequencies, wave propagation, diffraction phenomena, and optical filtering techniques.

Covers beam optics, Gaussian beams, and wavefront curvature in various applications.

Covers resolving power, interference, thin layers, diffraction, and Rayleigh criterion.

Explores Fresnel and Fraunhofer diffraction, near vs far field observations, lens focusing, and x-ray diffraction by crystals.

Explores the reciprocal lattice, diffraction patterns, and atomic structure extraction.

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Explores Fourier and Laplace transforms in materials science, focusing on light-matter interaction, diffraction patterns, and crystal properties.

Explores the rules of interference and diffraction patterns, including Young's experiment and Bragg's law.

Explores optical fiber modes, diffraction phenomena, and field calculations in fibers.