Particle Characterization: Methods and Applications

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Computer Vision: Image Formation and Transformation

Provides an overview of image formation and transformation principles in computer vision.

Crystallography: Describing Periodic Structures

Covers crystallography, lattice structures, vectors, and diffraction patterns.

Multiple beam scattering in electron diffraction

Explores multiple beam scattering in electron diffraction, focusing on zone axis diffraction patterns and theoretical approaches.

Interference of Light: Resolving Power of Diffraction Gratings

Explores the interference of light with diffraction gratings and calculating the number of slits needed to separate specific wavelengths.

Advanced Imaging: Centers Day

Covers fostering advanced imaging through interdisciplinary collaborations and high-impact developments at EPFL.

Rumors and beliefs

Explores conspiracy theories, analyzing their themes, authors, and levels of belief, and their impact post-9/11.

Ceramics: Powder Characterization

Explores the characterization of powders in ceramics, emphasizing the impact on ceramic properties and the manufacturing process.

Convolution Theorem: Sampling and Point Spread Functions

Covers the Convolution Theorem and Sampling and Point Spread Functions in image processing.

Imaging modes in TEM

Explores imaging modes in TEM, covering electron-matter interactions, diffraction patterns, image formation, contrast principles, and detector configurations.

Analyze Particles

Covers the process of analyzing particles in images using Fiji software.