Lecture

Imaging modes in TEM

Description

This lecture covers the imaging modes in Transmission Electron Microscopy (TEM), including electron source characteristics, specimen handling, lens systems, detectors, and camera configurations. It explains electron-matter interactions, electron diffraction patterns, and the principles of image formation, contrast, and diffraction in TEM. Emphasis is placed on mass-thickness contrast, bright-field and dark-field imaging, phase contrast, and high-resolution TEM. The lecture also delves into selected area electron diffraction, diffraction contrast imaging, and the use of Fresnel fringes for astigmatism correction.

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