Lecture
This lecture covers the imaging modes in Transmission Electron Microscopy (TEM), including electron source characteristics, specimen handling, lens systems, detectors, and camera configurations. It explains electron-matter interactions, electron diffraction patterns, and the principles of image formation, contrast, and diffraction in TEM. Emphasis is placed on mass-thickness contrast, bright-field and dark-field imaging, phase contrast, and high-resolution TEM. The lecture also delves into selected area electron diffraction, diffraction contrast imaging, and the use of Fresnel fringes for astigmatism correction.