Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Explores thermal noise in MOS Transistors, input noise of bipolar transistors, and noise in amplifier stages, mirrors, differential pairs, and opamps.
Covers the design of low-power analog integrated circuits, focusing on operational transconductance amplifiers (OTAs) and operational amplifiers (OPAMPs).
Explores noise in microelectronics, covering statistical characteristics, noise spectrum impact on circuits, and noise reduction techniques.
