Inelastic Scattering in Transmission Electron Microscopy

This lecture provides an introduction to inelastic scattering in transmission electron microscopy (TEM), focusing on the principles and applications of electron energy-loss spectroscopy (EELS). The instructor begins by defining inelastic and elastic scattering, emphasizing the conservation of energy and the significance of internal energy changes in scattering interactions. The discussion includes the geometry of scattering in TEM, detailing the accessible energy ranges and scattering angles, as well as the instrumental limitations that affect measurements. The lecture highlights the importance of understanding the scattering process, including the role of Bragg diffraction and phonon scattering. The instructor also addresses the challenges of achieving high energy resolution in EELS and the implications for studying material properties. Examples of recent advancements in EELS techniques are presented, showcasing the potential for high-energy loss measurements and the analysis of electronic structures. The lecture concludes with a preview of upcoming topics related to core-loss spectroscopy and the quantification of energy loss spectra.