Lecture

Intermediate Electron Microscopy Test: Detectors and Probes

In course

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Description

This lecture covers the use of detectors in electron microscopy, including secondary electron, backscattered electron, bright field, dark field, energy-dispersive X-ray, and electron backscatter diffraction detectors. It also discusses probe size control, chemical concentration impact, and contrast generation in topography.

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Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_9wb1a5p6

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