Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.
Explores the fundamentals and applications of High-Resolution Transmission Electron Microscopy, focusing on image formation, contrast transfer function, and optical system corrections.
Explores ptychography for imaging atoms and fields at picometer scale, covering resolution limits, depth sectioning, Lorentz microscopy, and detector advancements.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Explores the history of Transmission Electron Microscopy and the advancements in aberration correction techniques, discussing various contrasts in TEM imaging.
Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.
