Transmission Electron Microscopy: basics

Related lectures (32)

Page 3 of 4

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Explores the operation of a Transmission Electron Microscope, covering imaging modes and lens effects.

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Explores spherical, chromatic, and astigmatism aberrations in lenses, along with historical insights on lens aberrations.

Explores imaging modes in TEM, covering electron interactions, diffraction, contrast formation, and astigmatism correction.

Introduces transmission electron microscopy, covering its history, principles, and various contrast mechanisms used in imaging.